1995 IEEE International Reliability Physics Proceedings : 33rd annual, Las Vegas, Nevada, April 4, 5, 6, 1995

著者

• IEEE International Reliability and Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1995 IEEE International Reliability Physics Proceedings : 33rd annual, Las Vegas, Nevada, April 4, 5, 6, 1995

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c1995

• : soft.
• : case.
• : micro.

タイトル別名

1995 IEEE Annual International Reliability Physics

95CH34710

95CB34710

注記

Includes bibliographies

"IEEE Catalog No. 95CH3471-0."

詳細情報

• NII書誌ID(NCID): BA26091774
• ISBN:
  • 078032031X
  • 0780320328
  • 0780320336
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: vii, 405 p.
• 大きさ: 28 cm