Conference Record : AUTOTESTCON '95, August 8-10, 1995, Atlanta, Georgia : "Systems Readiness: Test Technology for the 21st Century"

著者

• Autotestcon
• Institute of Electrical and Electronics Engineers
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society

書誌事項

Conference Record : AUTOTESTCON '95, August 8-10, 1995, Atlanta, Georgia : "Systems Readiness: Test Technology for the 21st Century"

sponsored by: the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society

IEEE Service Center, c1995

• : soft.
• : case.

タイトル別名

1995 IEEE AUTOTESTCON

95CH35786

95CB35786

注記

Includes bibliographical references and index

"95CH35786."

詳細情報

• NII書誌ID(NCID): BA26202423
• ISBN:
  • 0780326210
  • 0780326229
• LCCN: 95076244
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: 587 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.A8
  • DC20 : 620/.0044
• 件名:
  • LCSH : Automatic checkout equipment -- Congresses
  • LCSH : Electronics in aeronatics -- Congresses
  • LCSH : Maintainabillty (Engineering) -- Congresses