X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California

著者

• Mills, Dennis M.
• Society of Photo-optical Instrumentation Engineers
• FAA Technical Center. Aviation Security Research & Development Service

書誌事項

X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California

Dennis M. Mills, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Aviation Security Research & Development Service, FAA Technical Center

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1550）

SPIE, c1991

注記

"Part of a five-conference program on X-Ray and EUV Technologies, held at SPIE's 1991 International Symposium on Optical Applied Science and Engineering, 21-26 July 1991, in San Diego, California"--P. v

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA26247964
• ISBN:
  • 0819406783
• LCCN: 91062628
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: viii, 172 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA417.2
  • DC20 : 620.1/1272
• 件名:
  • LCSH : Non-destructive testing -- Congresses
  • LCSH : X-ray spectroscopy -- Congresses
  • LCSH : Materials -- Testing -- Congresses
• 親書誌ID:
  • BA0022700X