Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.

著者

• Ashok, S.

書誌事項

Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.

editors, S. Ashok ... [et al.]

（Materials Research Society symposium proceedings, v. 378）

Materials Research Society, c1995

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA26261717
• ISBN:
  • 1558992812
• LCCN: 95022910
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, PA
• ページ数/冊数: xxii, 1054 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7871.85
  • DC20 : 621.3815/2
• 件名:
  • LCSH : Semiconductors
  • LCSH : Semiconductors -- Defects
  • LCSH : Semiconductors -- Impurity distribution
• 親書誌ID:
  • BA00013775