Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.

Author(s)

• Ashok, S.

Bibliographic Information

Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.

editors, S. Ashok ... [et al.]

（Materials Research Society symposium proceedings, v. 378）

Materials Research Society, c1995

Note

Includes bibliographical references and index

Details

• NCID: BA26261717
• ISBN:
  • 1558992812
• LCCN: 95022910
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pittsburgh, PA
• Pages/Volumes: xxii, 1054 p.
• Size: 24 cm
• Classification:
  • LCC : TK7871.85
  • DC20 : 621.3815/2
• Subject Headings:
  • LCSH : Semiconductors
  • LCSH : Semiconductors -- Defects
  • LCSH : Semiconductors -- Impurity distribution
• Parent Bibliography ID:
  • BA00013775