Interferometry : surface characterization and testing : 24 July 1992, San Diego, California

Author(s)

• Creath, Katherine
• Greivenkamp, John E.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Interferometry : surface characterization and testing : 24 July 1992, San Diego, California

Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1776）

SPIE, c1992

Note

Includes bibliographical references and index

Details

• NCID: BA26570074
• ISBN:
  • 0819409499
• LCCN: 92085390
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 184 p.
• Size: 28 cm
• Classification:
  • LCC : TA418.7
  • DC20 : 620/.44
• Subject Headings:
  • LCSH : Surfaces (Technology) -- Testing -- Congresses
  • LCSH : Surfaces (Technology) -- Optical properties -- Congresses
  • LCSH : Interferometry -- Congresses
• Parent Bibliography ID:
  • BA0022700X