Interferometry : surface characterization and testing : 24 July 1992, San Diego, California

著者

• Creath, Katherine
• Greivenkamp, John E.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Interferometry : surface characterization and testing : 24 July 1992, San Diego, California

Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1776）

SPIE, c1992

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA26570074
• ISBN:
  • 0819409499
• LCCN: 92085390
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 184 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA418.7
  • DC20 : 620/.44
• 件名:
  • LCSH : Surfaces (Technology) -- Testing -- Congresses
  • LCSH : Surfaces (Technology) -- Optical properties -- Congresses
  • LCSH : Interferometry -- Congresses
• 親書誌ID:
  • BA0022700X