Design to reduce technical risk

著者

• American Telephone and Telegraph Company

書誌事項

Design to reduce technical risk

AT&T

（Practical engineering guides for managing risk）

McGraw-Hill, c1993

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Written to provide a step-by-step approach through the design process, this book focuses on the practices and procedures that are vital to moving a product design into production successfully and avoiding technical risk right from the start. This important applications-oriented reference will help engineers and programme managers to reduce the design flaws that can jepoardize a project - and thereby achieve the highest possible quality. Included are numerous Department of Defense (DoD) templates that should serve as valuable procedural guides in applying the methods discussed. "Design to Reduce Technical Risk" features information on design policy, process, and analysis. There is also coverage of developments in software applications, as well as detailed discussion of design for testings, configuration control, and design release.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA26701445
• ISBN:
  • 0070025614
• LCCN: 92042750
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xvi, 752 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA174
  • DC20 : 620/.0042
• 件名:
  • LCSH : Engineering design
  • LCSH : Computer-aided design
• 親書誌ID:
  • BA22524326