Machine vision applications in industrial inspection III : 8-9 February 1995, San Jose, California

著者

• Wilson, Stephen S.
• Wu, Frederick Y.
• IS&T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision applications in industrial inspection III : 8-9 February 1995, San Jose, California

Frederick Y. Wu, Stephen S. Wilson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2423）

SPIE, c1995

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA26705854
• ISBN:
  • 081941770X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: ix, 378 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2
  • DC20 : 670.42/5
• 件名:
  • LCSH : Quality control -- Optical methods -- Automation -- Congresses
  • LCSH : Computer vision -- Congresses
• 親書誌ID:
  • BA0022700X