Surface analysis of paper

著者

書誌事項

Surface analysis of paper

edited by Terrance E. Connors, Sujit Banerjee

CRC Press, 1995

大学図書館所蔵 件 / 全6件

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper. Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods. Each chapter contains: An introduction A description of the technique A discussion of the type of information that can be obtained with the particular technique Practical examples to demonstrate the advantages of the technique

目次

Physical Characterization of Surfaces Three-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy, M.-C. Beland and P.J. Mangin Scanning Electron Microscopy: A Tool for the Analysis of Wood Pulp Fibers and Paper, G. de Silveira, P. Forsberg, and T.E. Conners Mechanical and Physical Properties of Paper Surfaces, J.F. Waterhouse The Surface Chemistry of Paper: Its Relationship to Printability and Other Paper Properties, F.M. Etzler and J.J. Conners Brightness Properties of Pulp and Paper, A.J. Ragauskas Spectroscopic Methods FT-IR Spectroscopy, M.A. Friese and S. Banerjee Near-Infrared Spectroscopy of Wood Products, J.M. Pope Raman Spectroscopy, U.P. Agarwal and R. Atalla Energy-Dispersive X-Ray Spectroscopic Analysis, G. de Silveira and T.E. Conners SIMS: Secondary Ion Mass Spectrometry, L.D. Detter-Hoskin and K.L. Busch X-Ray Photoelectron Spectroscopy, W.K. Istone Emerging Technologies Principles of Electron Energy Loss Spectroscopy and Its Application to the Analysis of Paper, G. Botton Surface Analysis Using Millimeter-Wave Resonant Instruments, J.S. Martens Atomic Force Microscopy, S.J. Hanley and D.G. Gray Using the Photon Tunneling Microscope to View Paper Surfaces, T.B. Arnold, T.E. Conners, and G.L. Dyer Index

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