Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California

Author(s)

• Williams, Clayton C.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California

Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1855）

SPIE, c1993

Other Title

Scanning probe microscopies two

Scanning probe microscopies 2

Note

Includes bibliographical references and index

Details

• NCID: BA26910172
• ISBN:
  • 0819410810
• LCCN: 93083323
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: ix, 220 p.
• Size: 28 cm
• Classification:
  • LCC : QH212.S33
  • DC20 : 502/.8/25
• Subject Headings:
  • LCSH : Scanning probe microscopy -- Congresses
• Parent Bibliography ID:
  • BA0022700X