Quantitative microscopy and image analysis : conference proceedings

書誌事項

Quantitative microscopy and image analysis : conference proceedings

editor, David J. Diaz

ASM International, c1994

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注記

"International Conference on Quantitative Microscopy and Image Analysis, Charlston, South Carolina, 19-21 July, 1993"

Includes bibliographical references

内容説明・目次

内容説明

Sponsored by Materials Characterization Committee of Materials Testing and Quality Control Division ASM Publication More precise data for quality control Accurate analysis of complex images Relationship between ultrasonic and metallographic measurements Correlation between 2- and 3- dimensional distributions. Sixteen selected papers examine theories, concepts and recent advances which will help you fill the need for more precise quality control and microstructure evaluation data through automatic image analysis. Computer-aided techniques now allow you to make fast, accurate quantification of morphological features recorded through optical metallography and scanning electron/transmission electron microscopy. Learn how accurate, reproducible measurements are being made from complex images which were previously difficult to analyze. Visual assessment of global properties and correlation with ultrasonic measurements are discussed. Subjects include: Mathematical Morphology Processing, Scanning Probe Microscopy, Infrared Sensing of Weld Penetration, Stereology of Anisotropic Microstructures Digital X-Ray Mapping.

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詳細情報
  • NII書誌ID(NCID)
    BA26913228
  • ISBN
    • 0871705117
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Materials Park, Ohio
  • ページ数/冊数
    iv, 133 p.
  • 大きさ
    29 cm
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