Quantitative microscopy and image analysis : conference proceedings

Bibliographic Information

Quantitative microscopy and image analysis : conference proceedings

editor, David J. Diaz

ASM International, c1994

Available at  / 4 libraries

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Note

"International Conference on Quantitative Microscopy and Image Analysis, Charlston, South Carolina, 19-21 July, 1993"

Includes bibliographical references

Description and Table of Contents

Description

Sponsored by Materials Characterization Committee of Materials Testing and Quality Control Division ASM Publication More precise data for quality control Accurate analysis of complex images Relationship between ultrasonic and metallographic measurements Correlation between 2- and 3- dimensional distributions. Sixteen selected papers examine theories, concepts and recent advances which will help you fill the need for more precise quality control and microstructure evaluation data through automatic image analysis. Computer-aided techniques now allow you to make fast, accurate quantification of morphological features recorded through optical metallography and scanning electron/transmission electron microscopy. Learn how accurate, reproducible measurements are being made from complex images which were previously difficult to analyze. Visual assessment of global properties and correlation with ultrasonic measurements are discussed. Subjects include: Mathematical Morphology Processing, Scanning Probe Microscopy, Infrared Sensing of Weld Penetration, Stereology of Anisotropic Microstructures Digital X-Ray Mapping.

by "Nielsen BookData"

Details

  • NCID
    BA26913228
  • ISBN
    • 0871705117
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Materials Park, Ohio
  • Pages/Volumes
    iv, 133 p.
  • Size
    29 cm
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