IEEE 1994 International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994

Author(s)

• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

IEEE 1994 International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994

sponsored by IEEE Electron Devices Society and IEEE Reliability Society

IEEE Service Center, c1994

Other Title

94TH06544

Note

Includes bibliographies and index

IEEE Catalog number: 94TH0654-4

Details

• NCID: BA27029685
• ISBN:
  • 0780319087
• LCCN: 94075834
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: v, 24, 155 p.
• Size: 28 cm