Quantitative x-ray spectrometry
著者
書誌事項
Quantitative x-ray spectrometry
（Practical spectroscopy, v. 20）
M. Dekker, c1995
2nd ed
大学図書館所蔵 全7件
注記
Includes bibliographical references and index
内容説明・目次
内容説明
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
目次
- The interaction of X-rays with matter
- sources for the excitation of characteristic X-rays
- instrumentation
- statistics
- general computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis
- specimen preparation
- qualitative analysis
- basic problems in quantitative analysis
- methods and models for quantitative analysis
- trace analysis
- radiation health hazards in X-ray spectrometry
- applications of X-ray spectrometry. Appendices: no-menclature
- mass absorption coefficients
- conversions and physical constants
- atomic weights and densities
- wavelengths and energies
- wavelength tables for K, L, and M series.
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