Machine vision applications in industrial inspection : 3-4 February 1993, San Jose, California

著者

• Wu, Frederick Y.
• Dawson, Benjamin M.
• IS&T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision applications in industrial inspection : 3-4 February 1993, San Jose, California

Frederick Y. Wu, Benjamin M. Dawson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1907）

SPIE, c1993

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA27096445
• ISBN:
  • 081941140X
• LCCN: 93083548
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: x, 272 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2
  • DC20 : 670.42/5
• 件名:
  • LCSH : Quality control -- Optical methods -- Automation -- Congresses
  • LCSH : Computer vision -- Congresses
• 親書誌ID:
  • BA0022700X