Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida

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Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida

Eamon B. Barrett, David M. McKeown, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1944）

SPIE, c1993

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Includes bibliographical references and index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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