Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
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書誌事項
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
（Materials science forum, v. 196-201）
Trans Tech Publications, c1995
- : set
- pt. 1
- pt. 2
- pt. 3
- pt. 4
- タイトル別名
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Defects in semiconductors 18
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pt. 1428.8:I61:18-19608-51346-4,
pt. 2428.8:I61:18-29608-51347-2, pt. 3428.8:I61:18-39608-51348-0, pt. 4428.8:I61:18-49608-51349-9 -
pt. 1428.8/Su 19/1071232000093308,
pt. 2428.8/Su 19/2071232000093311, pt. 3428.8/Su 19/3071232000093323, pt. 4428.8/Su 19/4071232000093335 -
pt. 1549-8-59//18-1030009608337,
pt. 2549-8-5-//18-2030009608338, pt. 3549-8-5//18-3030009608339, pt. 4549-8-5//18-4030009608340 -
pt. 1M2365010961050X,
pt. 2M23650109610518, pt. 3M23650109610526, pt. 4M23650109610534 -
pt. 1428.8||I 57||1995-1,
pt. 2428.8||I 57||1995-2, pt. 3428.8||I 57||1995-3, pt. 4428.8||I 57||1995-4 -
pt. 1428.8||Su19||1T10657235,
pt. 2428.8||Su19||2T10657300, pt. 3428.8||Su19||3T10657312, pt. 4428.8||Su19||4T10657324 -
pt. 1428.8//Su19//12980002405,
pt. 2428.8//Su19//22980002416, pt. 3428.8//Su19//32980002427, pt. 4428.8//Su19//42980002438 -
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