Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995

Author(s)

Bibliographic Information

Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995

edited by Masashi Suezawa and Hiroshi Katayama-Yoshida

(Materials science forum, v. 196-201)

Trans Tech Publications, c1995

  • : set
  • pt. 1
  • pt. 2
  • pt. 3
  • pt. 4

Other Title

Defects in semiconductors 18

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Details

  • NCID
    BA27177886
  • ISBN
    • 0878497161
    • 0878497129
    • 0878497137
    • 0878497145
    • 0878497153
  • Country Code
    sz
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Zürich, Switzerland
  • Pages/Volumes
    4 v. (xliii, 2027 p.)
  • Size
    25 cm
  • Classification
  • Parent Bibliography ID
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