Defects in semiconductors I, NCDS-1 : proceedings of the 1st National Conference on Defects in Semiconductors, held in St. Petersburg, Russia, April 26-30, 1992

著者

• Bagraev, Nickolay T.
• National Conference on Defects in Semiconductors

書誌事項

Defects in semiconductors I, NCDS-1 : proceedings of the 1st National Conference on Defects in Semiconductors, held in St. Petersburg, Russia, April 26-30, 1992

editor, Nickolay T. Bagraev

, c1993

タイトル別名

NCDS-1

注記

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BA27353934
• ISBN:
  • 0878496661
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Zug], Switzerland ; Scitec Publications
• ページ数/冊数: 678 p.
• 大きさ: 25 cm
• 分類:
  • LCC : QC611.6.D4
  • DC19 : 537.6/22
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses