Machine vision applications in industrial inspection II : 8-9 February 1994, San Jose, California

Author(s)

• Dawson, Benjamin M.
• Wilson, Stephen S.
• Wu, Frederick Y.
• IS&T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Machine vision applications in industrial inspection II : 8-9 February 1994, San Jose, California

Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2183）

SPIE, c1994

• pbk.

Note

Includes bibliographical references and index

Details

• NCID: BA2739602X
• ISBN:
  • 0819414786
• LCCN: 93087318
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: ix, 336 p.
• Size: 28 cm
• Classification:
  • LCC : TS156.2
  • DC20 : 670.42/5
• Subject Headings:
  • LCSH : Quality control -- Optical methods -- Automation -- Congresses
  • LCSH : Computer vision -- Congresses
• Parent Bibliography ID:
  • BA0022700X