書誌事項

Remote sensing and GIS for site characterization : applications and standards

V.H. Singhroy, D.D. Nebert, and A.I. Johnson, editors

(ASTM special technical publication, 1279)

ASTM, c1996

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注記

Selected papers from the International Symposium on Remote Sensing and GIS for Site Characterization--Applications and Standards, held Jan. 27-28, 1994, in San Francisco, Calif

"ASTM publication code number (PCN) 04.012790-38."

Includes bibliographical references and indexes

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