Proceedings of the Symposium on Reliability of Metals in Electronics

著者

• Symposium on Reliability of Metals in Electronics
• Rathore, Hazara S.
• Electrochemical Society. Dielectric Science and Technology Division
• Electrochemical Society. Electronics Division
• Electrochemical Society. Meeting

書誌事項

Proceedings of the Symposium on Reliability of Metals in Electronics

edited by Hazara S. Rathore

（Proceedings / [Electrochemical Society], v. 95-3）

Electrochemical Society, c1995

• : pbk

注記

Held during the Spring Meeting of the Electrochemical Society, May 21 to 26 1995 in Reno, Nevada

"Sponsored by the Dielectric Science and Technology and the Electronics Divisions"--Preface

Includes bibliographical references and indexes

• NII書誌ID(NCID): BA27991850
• ISBN:
  • 1566770971
• LCCN: 95060438
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ
• ページ数/冊数: viii, 245 p.
• 大きさ: 23
• 分類:
  • LCC : TK7872.T55
• 件名:
  • LCSH : Thin film devices -- Reliability -- Congresses
  • LCSH : Metallic films -- Electric properties -- Congresses
  • LCSH : Breakdown (Electricity) -- Congresses
  • LCSH : Electrodiffusion -- Congresses
• 親書誌ID:
  • BA01323290