Proceedings of the Symposium on Reliability of Metals in Electronics

Author(s)

• Symposium on Reliability of Metals in Electronics
• Rathore, Hazara S.
• Electrochemical Society. Dielectric Science and Technology Division
• Electrochemical Society. Electronics Division
• Electrochemical Society. Meeting

Bibliographic Information

Proceedings of the Symposium on Reliability of Metals in Electronics

edited by Hazara S. Rathore

（Proceedings / [Electrochemical Society], v. 95-3）

Electrochemical Society, c1995

• : pbk

Note

Held during the Spring Meeting of the Electrochemical Society, May 21 to 26 1995 in Reno, Nevada

"Sponsored by the Dielectric Science and Technology and the Electronics Divisions"--Preface

Includes bibliographical references and indexes

Details

• NCID: BA27991850
• ISBN:
  • 1566770971
• LCCN: 95060438
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pennington, NJ
• Pages/Volumes: viii, 245 p.
• Size: 23
• Classification:
  • LCC : TK7872.T55
• Subject Headings:
  • LCSH : Thin film devices -- Reliability -- Congresses
  • LCSH : Metallic films -- Electric properties -- Congresses
  • LCSH : Breakdown (Electricity) -- Congresses
  • LCSH : Electrodiffusion -- Congresses
• Parent Bibliography ID:
  • BA01323290