Integrating reliability into microelectronics manufacturing

Author(s)

• Christou, Aris

Bibliographic Information

Integrating reliability into microelectronics manufacturing

Aris Christou

（Design and measurement in electronic engineering）

Wiley, c1994

• : pbk

Note

Includes bibliographical references and index

入力は遡及データによる

Details

• NCID: BA28000306
• ISBN:
  • 0471944076
  • 0471944084
• LCCN: 93043467
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Chichester ; New York
• Pages/Volumes: xii, 349 p.
• Size: 25 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/068/5
• Subject Headings:
  • LCSH : Microelectronics -- Quality control
  • LCSH : Integrated circuits -- Reliability
• Parent Bibliography ID:
  • BA06818508