Atom probe field ion microscopy
著者
書誌事項
Atom probe field ion microscopy
（Monographs on the physics and chemistry of materials, 52）（Oxford science publications）
Clarendon Press, 1996
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注記
Includes references
内容説明・目次
内容説明
This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting
applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.
目次
- 1. Historical background and general introduction
- 2. Physical principles of field ion microscopy
- 3. FIM image interpretation and application
- 4. Physical principles of atom probe interpretation
- 5. Statistical analysis of atom probe data
- 6. Metallurgical applications
- 7. Atom probe studies of non-metallic materials, thin films and surface phenomena
- Epilogue: future directions
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