Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
著者
書誌事項
Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
（Materials Research Society symposium proceedings, v. 405）
Materials Research Society, c1996
大学図書館所蔵 全7件
注記
Includes bibliographical references and index
内容説明・目次
内容説明
This book addresses the importance of surface and stresses, particularly in the realm of decreasing structure size, where surface-to-volume ratio increases significantly. In these nanoscale systems, the surface properties and stresses become a critical issue when considering the resulting physical properties. The book also focuses on the use of novel experimental techniques capable of measuring these properties on a micron or submicron scale, including local stress mapping and localized surface chemistry determination. Topics include: the effects of strain on electronic and vibrational properties of semiconductor structures; nanostructure formation - growth and stress effects; fabricated nanostructures - stress effects; porous silicon - materials and optical properties; deposition and surface properties of semiconductor nanostructures; semiconductor interfaces; materials characterization - X-ray and strain measurements; materials characterization - surface passivation and structural defect studies; and metal, ceramic and polymer nanostructures.
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