Scanning electron microscopy 1974 : proceedings of the Part 1 (April 8, 9, 1974) 7th Annual Scanning Electron Microscopy Symposium, Part 2 (April 10, 11, 1974) Scanning Electron Microscopy and the Plant Sciences, Part 3 (April 10, 11, 1974) Advences in Biomedical Applications of the Scanning Electron Microscope, Part 4 (April 10, 11, 1974) Failure Analysis and the Scanning Electron Microscope

著者

• Johari, Om
• Corvin, Irene
• IIT Research Institute
• International Symposium on Scanning Electron Microscopy

書誌事項

Scanning electron microscopy 1974 : proceedings of the Part 1 (April 8, 9, 1974) 7th Annual Scanning Electron Microscopy Symposium, Part 2 (April 10, 11, 1974) Scanning Electron Microscopy and the Plant Sciences, Part 3 (April 10, 11, 1974) Advences in Biomedical Applications of the Scanning Electron Microscope, Part 4 (April 10, 11, 1974) Failure Analysis and the Scanning Electron Microscope

edited by Om Johari and Irene Corvin

IIT Research Institute, 1974

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA28582562
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Chicago, Illnois
• ページ数/冊数: xvi, 1064 p.
• 大きさ: 29 cm
• 分類:
  • LCC : QH212.S3
  • DC : 578/.4/5
• 件名:
  • LCSH : Scanning electron microscope -- Congresses