Scanning electron microscopy 1974 : proceedings of the Part 1 (April 8, 9, 1974) 7th Annual Scanning Electron Microscopy Symposium, Part 2 (April 10, 11, 1974) Scanning Electron Microscopy and the Plant Sciences, Part 3 (April 10, 11, 1974) Advences in Biomedical Applications of the Scanning Electron Microscope, Part 4 (April 10, 11, 1974) Failure Analysis and the Scanning Electron Microscope

Author(s)

• Johari, Om
• Corvin, Irene
• IIT Research Institute
• International Symposium on Scanning Electron Microscopy

Bibliographic Information

Scanning electron microscopy 1974 : proceedings of the Part 1 (April 8, 9, 1974) 7th Annual Scanning Electron Microscopy Symposium, Part 2 (April 10, 11, 1974) Scanning Electron Microscopy and the Plant Sciences, Part 3 (April 10, 11, 1974) Advences in Biomedical Applications of the Scanning Electron Microscope, Part 4 (April 10, 11, 1974) Failure Analysis and the Scanning Electron Microscope

edited by Om Johari and Irene Corvin

IIT Research Institute, 1974

Note

Includes bibliographical references and index

Details

• NCID: BA28582562
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Chicago, Illnois
• Pages/Volumes: xvi, 1064 p.
• Size: 29 cm
• Classification:
  • LCC : QH212.S3
  • DC : 578/.4/5
• Subject Headings:
  • LCSH : Scanning electron microscope -- Congresses