1996 IEEE International Reliability Physics Proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996

Author(s)

• IEEE International Reliability and Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

1996 IEEE International Reliability Physics Proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c1996

• : soft.
• : case.
• : micro.

Other Title

1996 IEEE Annual International Reliability Physics

95CH35825

96CB35825

Note

Includes bibliographies

"IEEE Catalog No. 96CH35825"

Details

• NCID: BA28589211
• ISBN:
  • 0780327535
  • 0780327543
  • 0780327551
• LCCN: 82640313
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway
• Pages/Volumes: vi, 396 p.
• Size: 28 cm