Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, March 5-7, 1996, Four Seasons Hotel, Austin, TX USA

著者

• IEEE Semiconductor Thermal Measurement and Management Symposium
• Institute of Electrical and Electronics Engineers

書誌事項

Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, March 5-7, 1996, Four Seasons Hotel, Austin, TX USA

IEEE Service Center, c1996

• : soft.
• : case.

タイトル別名

1996 IEEE 12th Annual Semiconductor Thermal Measurement & Management Symposium

96CH35890

96CB35890

注記

"IEEE catalog number 95CH35890"

詳細情報

• NII書誌ID(NCID): BA2860517X
• ISBN:
  • 0780331397
  • 0780331400
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: xiii, 251 p.
• 大きさ: 28 cm