書誌事項

Transmission electron microscopy

David B. Williams and C. Barry Carter

Plenum Press, c1996

  • set
  • 1 : Basics : pbk
  • 2 : Diffraction : pbk
  • 3 : Imaging : pbk
  • 4 : Spectrometry : pbk

タイトル別名

Transmission electron microscopy : a textbook for materials science

大学図書館所蔵 件 / 21

この図書・雑誌をさがす

注記

Includes bibliographical references and index

Vol.1 subtitle: a textbook for materials science

内容説明・目次

内容説明

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

目次

Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to 'See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.

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