A probabilistic analysis of test-response compaction

Author(s)

• Pilarski, Slawomir
• Kameda, Tiko

Bibliographic Information

A probabilistic analysis of test-response compaction

Slawomir Pilarski and Tiko Kameda

IEEE Computer Society Press, c1995

Note

Includes bibliographical references (p. 89-94)

Description and Table of Contents

Description

Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc

by "Nielsen BookData"

Details

• NCID: BA28646188
• ISBN:
  • 0818665327
• LCCN: 94027227
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif. ; Tokyo
• Pages/Volumes: x, 95 p.
• Size: 26 cm
• Classification:
  • LCC : TK7867
  • DC20 : 621.3815/48/015192
• Subject Headings:
  • LCSH : Electronic circuits -- Testing
  • LCSH : Fault-tolerant computing
  • LCSH : Probabilities