Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana

Author(s)

• IEEE Computer Society
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• International Workshop on Defect and Fault Tolerance in VLSI Systems

Bibliographic Information

Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana

sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing

IEEE Computer Society Press, c1995

• : microfiche

Other Title

95TB100009

Note

Includes bibliographical references and index

"IEEE catalog number 95TB100009"

Details

• NCID: BA28647533
• ISBN:
  • 0818671076
  • 0818673826
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, CA. ; Tokyo
• Pages/Volumes: x, 305 p.
• Size: 24 cm