ICMTS 1996 : 1996 IEEE International Conference on Microelectronic Test Structures : March 25-28, 1996, Trento, Italy, proceedings

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 1996 : 1996 IEEE International Conference on Microelectronic Test Structures : March 25-28, 1996, Trento, Italy, proceedings

sponsored by the IEEE Electron Devices Society

IEEE Service Center, c1996

• : soft.
• : case.

タイトル別名

1996 IEEE International Conference on Microelectronic Test Structures

96CH35832

96CB35832

注記

"IEEE catalog number: 96CH35832"

詳細情報

• NII書誌ID(NCID): BA28695241
• ISBN:
  • 0780327837
  • 0780327845
• LCCN: 95077997
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: xi, 313 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/5
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses