Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Author(s)

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Ong, Soon Huat
• Radhakrishnan, M. K.
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• Institute of Microelectronics
• Magnetics Technology Centre

Bibliographic Information

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore

Institute of Electrical and Electronics Engineers, c1995

Other Title

95TH8113

Note

"IPFA '95 proceedings"--Cover

"IEEE catalog no. 95TH8113"--Cover

"27 November - 1 December 1995, Shangri-La Hotel, Singapore"--Cover

Includes bibliographical references and index

Details

• NCID: BA28811400
• ISBN:
  • 0780327977
• LCCN: 95078165
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: 230 p.
• Size: 30 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.3815
• Subject Headings:
  • LCSH : Integrated circuits -- Defects -- Congresses
  • LCSH : Integrated circuits -- Testing -- Congresses