1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Service Center, c1996

タイトル別名

95TH8086

注記

"IEEE Catalog Number 95TH8086."

Includes bibliographical references

• NII書誌ID(NCID): BA28812028
• ISBN:
  • 0780327055
• LCCN: 95077004
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataeay, N.J.
• ページ数/冊数: vi, 172 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Reliability -- Congresses
  • LCSH : Integrated circuits -- Wafer scale integration -- Reliability -- Congresses