Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
著者
書誌事項
Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
（Materials Research Society symposium proceedings, v. 411）
Materials Research Society, 1996
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Impedance and/or dielectric spectroscopy are being used to monitor hydration in cements, flux solder in PC boards, sintering of ceramic materials, mechanical and environmental degradation of materials, etc. This is the first book from MRS to focus on the application of electrical measurements for the detection of microstructural features at all length scales (atomic to macroscopic). The electrical techniques discussed include dc and ac resistivity measurements, complex impedance analysis, multiplane analysis and various other methods such as electron energy loss spectroscopy, ellipsometry, capacitance voltage measurements and others. Research covers all classes of materials including electroceramics, biological materials, polymers, metals and a variety of composites. Advances in the techniques for the interpretation of data and monitoring of materials-related phenomena are emphasized. Topics include: advances in experimental techniques and applications; advances in interpretation of frequency dependence; characterization of defects; composition and structure profiling; electrode effects; grain boundary effects; composites and porous materials.
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