Transmission electron microscopy : a textbook for materials science

著者

• Williams, David B. (David Bernard)
• Carter, C. Barry

書誌事項

Transmission electron microscopy : a textbook for materials science

David B. Williams and C. Barry Carter

Plenum Press, 1996

• : Hardbound
• pbk.

注記

Includes bibliographical references and index

内容説明・目次

巻冊次

: Hardbound ISBN 9780306452475

内容説明

A textbook for a senior or first-year graduate introductory course. Focuses on the two questions of why a particular technique of transmission electron microscopy should be used, and how the principles and procedures should be put into practice. Provides a sound theoretical base without going into s

巻冊次

pbk. ISBN 9780306453243

内容説明

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

目次

Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to 'See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.

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詳細情報

• NII書誌ID(NCID): BA28971790
• ISBN:
  • 0306452472
  • 030645324X
• LCCN: 96028435
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xxvii, 729 p.
• 大きさ: 29 cm
• 分類:
  • LCC : TA417.23
  • DC20 : 502/.8/25
• 件名:
  • LCSH : Materials -- Microscopy
  • LCSH : Transmission electron microscopy