Proceedings : 30th annual meeting of the Electron Microscopy Society of America and First Pacific Regional Conference on Electron Microscopy, Los Angeles, California, August 14-17, 1972

著者

• Annual Meeting Electron Microscopy Society of America
• Arcenaaux, Claude J.
• Electron Microscopy Society of America

書誌事項

Proceedings : 30th annual meeting of the Electron Microscopy Society of America and First Pacific Regional Conference on Electron Microscopy, Los Angeles, California, August 14-17, 1972

edited by Claude J. Arceneaux

Claitor's, 1972

タイトル別名

Electron Microscopy

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA29031779
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Baton Rouge
• ページ数/冊数: 703 p.
• 大きさ: 27 cm