Handbook of microscopy : applications in materials science, solid-state physics and chemistry

著者

• Amelinckx, Severin

書誌事項

Handbook of microscopy : applications in materials science, solid-state physics and chemistry

edited by S.Amelinckx ... [et al.]

VCH, c1997

• Methods 1
• Methods 2
• Applications

注記

Includes bibliographical references and index

内容説明・目次

巻冊次

Methods 1 ISBN 9783527292806

内容説明

The first of two volumes describing microscopy techniques in materials science, including the physical background of the individual techniques, instrumentation, and image analysis. Guidelines are provided about the choice of microscopy technique best suited to obtain a desired piece of information.

目次

• Light Microscopy
• X-ray Microscopy
• Microtomography
• Acoustic Microscopy
• Scanning Laser Acoustic Microscopy
• Electron Microscopy
• Scanning Beam Methods
• Magnetic Methods
• Microscopy with Polarization Analysis (SEMPA)
• Emission Methods
• Field Emission Microscopy (FEM)
• Scanning Point Probe Techniques
• Image Recording
• Handling and Processing.

巻冊次

Applications ISBN 9783527292936

内容説明

Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Classes of Materials: Metals and Alloys, Rocks and Minerals, Semiconductors and Semiconducting Devices, Opto-electronic Materials, Ferroic Materials, Structural Ceramics, Gemmological Applications. Superconductors: Intermetallics and Ceramics, Nonperiodic Structures, Dental and Biomaterials, Application of TEM and SAED, Different Forms of Carbon, Composite Structural Materials, Polymers, Nuclear Materials, Magnetic Materials. Special Topics: Phase Transformations, Specimen Preparation Techniques, Environmental Problems, Thin Film Growth, Quantitative Hyleography.

目次

Classes of Materials: Metals and Alloys, Rocks and Minerals, Semiconductors and Semiconducting Devices, Opto-electronic Materials, Ferroic Materials Structural Ceramics, Gemmological Applications. Superconductors: Intermetallics and Ceramics, Non-periodic Structures, Dental and Biomaterials, Application of TEM and SAED, Different Forms of Carbon, Composited Structural Materials, Polymers, Nuclear Materials, Magnetic Materials. Special Topics: Phase Transformations, Specimen Preparation Techniques, Environmental Problems. Thin Film Growth, Quantitative Hyleography.

巻冊次

Methods 2 ISBN 9783527294732

内容説明

Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Electron Microscopy: Scanning Beam Methods, Magnetic Methods: NMR-Microscopy, Scanning Electron Microscopy with Polarization Analysis (SEMPA). Emission Methods: Photoemission Electron Microscopy, Field Emission Microscopy (FEM), Field Ion Microscopy. Scanning Point Probe Techniques: Scanning Tunnelling Microscopy STM, Atomic Force Microscopy AFM, Magnetic Force Microscopy MFM, Ballistic Electron Emission Microscopy (BEEM), Methods Under Development. Image Recording, Handling and Processing: Electronic Image Recording. Image Processing Special Topics: Coincidence Microscopy, Low Energy Holography.

目次

ELECTRON MICROSCOPY. Scanning Beam Methods. MAGNETIC METHODS. Nuclear Magnetic Resonance. Scanning Electron Microscopy with Polarization Analysis (SEMPA). Spin-Polarized Low-Energy Electron Microscopy. EMISSION METHODS. Photoelectron Emission Microscopy. Field Emission and Field Ion Microscopy (Including Atom Probe FIM). SCANNING POINT PROBE TECHNIQUES. Scanning Tunneling Microscopy. Scanning Force Microscopy. Magnetic Force Microscopy. Ballistic Electron Emission Microscopy. IMAGE RECORDING, HANDLING AND PROCESSING. Image Recording in Microscopy. Image Processing. SPECIAL TOPICS. Coincidence Microscopy. Low Energy Electron Holography and Point-Projection Microscopy.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA2929444X
• ISBN:
  • 3527292802
  • 3527294732
  • 3527292934
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Weinheim ; Tokyo
• ページ数/冊数: 3 v.
• 大きさ: 25 cm
• 分類:
  • NDC8 : 549.97