Instabilities in MOS devices

Author(s)

• Davis, J. R. (John Richard)

Bibliographic Information

Instabilities in MOS devices

J. R. Davis

（Electrocomponent science monographs, v. 1）

Gordon & Breach Science Publishers, c1981

Note

Includes index

Details

• NCID: BA30281638
• ISBN:
  • 0677055900
• LCCN: 80025156
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xv, 175 p.
• Size: 29 cm
• Classification:
  • LCC : TK7871.99.M44
  • DC19 : 621.3815/2
• Subject Headings:
  • LCSH : Metal oxide semiconductors
• Parent Bibliography ID:
  • BA0363362X