Image assessment & specification : seminar-in-depth, May 20-22, 1974, Rochester, New York
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Image assessment & specification : seminar-in-depth, May 20-22, 1974, Rochester, New York
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 46)
Society of Photo-Optical Instrumentation Engineers, c1974
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遡及データをもとにした流用入力
Includes bibliographical references and index