Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995

著者

• International Conference on Secondary Ion Mass Spectrometry
• Benninghoven, A.

書誌事項

Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995

editors, A. Benninghoven ... [et al.]

Wiley, c1997

詳細情報

• NII書誌ID(NCID): BA30467840
• ISBN:
  • 0471958972
• LCCN: 88647380
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Chichester
• ページ数/冊数: xxv, 1057 p.
• 大きさ: 24 cm
• 分類:
  • DC20 : 543.0873
• 件名:
  • LCSH : Secondary ion mass spectrometry -- Congresses