Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995

Author(s)

• International Conference on Secondary Ion Mass Spectrometry
• Benninghoven, A.

Bibliographic Information

Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995

editors, A. Benninghoven ... [et al.]

Wiley, c1997

Details

• NCID: BA30467840
• ISBN:
  • 0471958972
• LCCN: 88647380
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Chichester
• Pages/Volumes: xxv, 1057 p.
• Size: 24 cm
• Classification:
  • DC20 : 543.0873
• Subject Headings:
  • LCSH : Secondary ion mass spectrometry -- Congresses