Condensed guide for the Stanford revision of the Binet-Simon intelligence tests

Author(s)

• Terman, Lewis Madison

Bibliographic Information

Condensed guide for the Stanford revision of the Binet-Simon intelligence tests

by Lewis M. Terman

（Riverside textbooks in education）

Houghton Mifflin, 1920

Details

• NCID: BA3070412X
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: 32 p.
• Size: 22 cm
• Subject Headings:
  • FREE : Intelligence tests
• Parent Bibliography ID:
  • BA00478189