1996 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1996 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Service Center, c1997

タイトル別名

96TH8215

注記

"IEEE Catalog Number 96TH8215."

Includes bibliographical references

内容説明・目次

内容説明

The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. The 1996 Final Report includes papers, abstracts, and summaries from the conference.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA31189947
• ISBN:
  • 0780335988
• LCCN: 96077509
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataeay, N.J.
• ページ数/冊数: 175 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Reliability -- Congresses
  • LCSH : Integrated circuits -- Wafer scale integration -- Reliability -- Congresses