Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996
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Bibliographic Information
Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996
（Materials science forum, v. 248-249）
Trans Tech Publications, c1997
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Description and Table of Contents
Description
The first particle accelerators were built in the early 1930's. For a long time, these devices were used exclusively by nuclear physicists. In the 1960's, extensive developments in measuring techniques occurred, mainly as a result of newly developed semiconductor devices. Further strong interest arose from the semiconductor industry, and ion implantation became widely accepted as being the ultimate tool for Si-based device fabrication.
Table of Contents
Ion Beam Induced Amorphization of Crystalline Solids: Mechanisms and Modeling
Surface Effect on the Nature of Damage Production in Ion-Irradiated Solids: A Molecular Dynamics Investigation
The Thermal Spike Model: A Possible Way to Describe the Effects Induced in Y2O3 by Swift Heavy Ion Irradiations
Stopping Power and Range Relations for Low and High Z Ions in Solids: A Critical Analysis
Modeling of Ion Implantation and Diffusion in Si
Crystal-Grid Investigation of Atomic Collision Cascades in Ionic Compounds
Thermal Spike Description of the Damage Creation in Y3Al5O12 Induced by Swift Heavy Ions
Track Formation in Metals under Swift Heavy Ion Bombardment
Diffusion in Ion Irradiated Nickel: Determination of Atomic Mixing, Sink Strength and Fraction of Freely Migrating Defects
Ion-Beam Modification of Semiconductors and Related Electronic Materials
Ion Beam Induced Epitaxial Crystallization of Buried SiC Layers in Silicon
Ion Beam Induced Epitaxial Regrowth and Interfacial Amorphization of Compound Semiconductors
Effects of Ion Irradiation on Ferromagnetic Thin Films
Special Surface Structures in Surface Alloy Growth
Charge Carrier Lifetime Modificaiton in Silicon by High Energy H+, He+ Ion Implantation
Range Parameters of Aluminium Implanted Targets
Identifitcation of Bandgap States in Semiconductors by Transmutation of Implanted Radioactive Tracers
Hall Effect Measurements on Transmutation Doped Semiconductors
Characterization of Cu/Al2O3 Interfaces after Heavy Ion Irradiation
In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope
Hardness Enhancement and Crosslinking Mechanisms in Polystyrene Irradiated with High Energy Ion-Beams
Diffusion Studies in Polymers Using MeV Ion Beams
Ion Induced Passivation of Metal Surfaces: The Phenomenon and its Origins
Flux Pinning by Columnar Defects in Bi2Sr2CaCu2O8-Thin Films
Depth Resolved Oxygen Analysis at the Interfaces of Au-Al Layers
Substrate Influence on Topography and Chemical Composition of Thin Metal Films Produced by Means of Self-Ion Assisted Deposition
Radiation Damage and Amorphization Mechanisms in Xe+ Irradiated CuInSe2 Single Crystals
Ion Beam Mixing in Epitaxial Ag/Fe/Ag-(001)-Layers Investigated with Ferromagnetic Resonance and X-Ray-Diffraction
Thermal Depth Profiling of Nickel after He-Ion Irradiation
The Role of Surface Carbon Contamination on the Tribological Properties of Ion-Implanted 100Cr6 Bearing Steel
Ion Implantation into Stainless Steel - Depth Selective Phase Analysis with an Improved Moessbauer Technique
Formation of Aluminum Gradient Films on Stainless Steel by Ion Implantation
Studies on Ion Beam Modification and Analysis Using the Bucharest Cyclotron
Microstructure and Tribology of Carbon Implanted High-Speed-Steel
Investigation of High Fluence Carbon Ion Implanted Titanium
Depth Distributions and Wear Behaviour of Ion Implanted Ti6Al4V
Defect Formation in irradiated Nanostructured Materials
TiN Coatings Formed by Dual Beam IBAD Technique
Creation of the DLC Layer by the Dual Beam IBAD Technique
Application of High Energy Ion Beams for Local Lifetime Control in Silicon
Ion Implantation Induced Damage Accumulation Studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry
Plasma Immersion Ion Implantation of Nitrogen into Porous Silicon Layers
Formation of Buried SiC Layers in Silicon by Ion Beam Synthesis
Lattice Damage of Relaxed Si1-xGex Alloys of Various Composition Implanted with 2 MeV Si Ions
Auger Depth Profiling with Good Depth Resolution of Low Energy Implantation Induced Ion Mixing
Defect Formation by Low Energy Ions during Sputter Deposition of TiW and Au on Epitaxially Grown n-Si at Different Plasma Pressures
Pulsed Electron Beam Annealing of GaAs after High Dose Implantation of Hydrogen
Dose Rate and Temperature Dependence of the Crystallization Rate during IBIEC in InAs
Damage Production in Ion Implanted III-V Compounds: A Comparative Study
The Behaviour of 12B in CdTe Studied with -NMR Techniques
Ion Beam and Electrical Conductivity Analysis of Nanocrystalline -BN and -Al2O3 Ceramics Implanted with Ti+n Ions and Annealed
Nucleation and Growth of the Amorphous Phase in Na-Irradiated Quartz
Vacancy Type Defects in Proton Irradiated SiC
On the Amorphization of the Si/Ge Superlattices upon Ion Bombardement
Application of HIERDA to Strontium Bismuth Tantalate Ferroelectric Films
Void Formation and Surface Rippling in Ge Induced by High Energetic Au Irradiation
Micro-IBA and Micro-AMS for Geological Materials
Long and Short Range Order in Ion Irradiated Ceramics Studied by IBA, EXAFS and Raman
Progress in Non-Standard Defect Analysis by RBS
Heavy Ion Recoil Time of Flight Method for Materials Analysis
Transition-Metal Silicide Layer Formation, the Phases of Mixed Silicides
Composition and Structure of Codeposited Layers on Plasma Facing Components in Controlled Fusion Devices: Ion Beam and Microscopy Studies
Ion-Beam Analysis of Solar-Cell Materials
Evaluation of Coatings Produced by Low-Energy Ion Assisted Deposition of Co on Silicon
Application of the Combined Channeling Method at Higher Ion Energies on Cyclotron
Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry
Hydrogen Elastic Recoil Detection Depth Resolution and Sensitivity as a Function of Sample Composition
Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
Combining RBS and FTIR Spectroscopy for the Ge Analysis in Si1-xGex Single Crystals
Hydrogen and Nitrogen Loss during ERD Analysis of Siliicon (Oxy)nitrides
Composition and Structural Evolution of Al-Me Alloys (Me = Fe, Cu, Sb) Prepared by Means of Ultrarapid Quenching from the Melt Studied by RBS Technique
Diffusion of Water into Quartz and Silica Glass
Lattice Location of Hf in Near-Stoichiometric LiNbO3: RBS/Channeling and PAC Studies
(1 - 3) MeV / amu Heavy Ion Irradiaiton Effects on Optical Properties of Al2O3
Ion Beam Analysis and Applications in On-Line Monitoring of Ion Induced Modifications of Materials
Thin-Film Morphology and Rutherford Backscattering Spectrometry
Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au69+
Ion Channeling Study of GaN Single Crystals
Highly Focused Ion Beams in Integrated Circuit Testing
Atomic Structure and Electrical Properties of a Supertip Gas Field-Ion Source
High Energy Ion Microprobes: Where are we going?
Application of Highly Focused Ion Beams
Use of an Ultra-High Resolution Magnetic Spectrograph for Materials Research
Ion Beam Analysis with Monolayer Depth Resolution
Applications of Ion Track Filters
Theoretical and Experimental Study of the Stationary and Kinetic Characteristics of the Thermo-Field Ion Sources
Status of a New Analytical Facility Based on the 2 MeV Electrostatic Accelerator in the Institute of Applied Physics
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