Electron microprobe analysis
Author(s)
Bibliographic Information
Electron microprobe analysis
Cambridge University Press, 1997, c1993
2nd ed
- : pbk
Available at / 16 libraries
-
The Institute for Solid State Physics Library. The University of Tokyo.図書室
: pbk433.5:E1e7210142118
-
No Libraries matched.
- Remove all filters.
Note
Includes bibliographical references and index
Description and Table of Contents
Description
This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.
Table of Contents
- 1. Introduction
- 2. Essential features of the electron microprobe
- 3. Electron gun
- 4. The probe-forming system
- 5. Scanning
- 6. Wavelength-dispersive spectrometers
- 7. Proportional counters
- 8. Counting electronics
- 9. Lithium-drifted silicon detectors
- 10. Electronics for energy-dispersive systems
- 11. Wavelength-dispersive analysis
- 12. Energy-dispersive analysis
- 13. X-ray generation and stopping power
- 14. Electron backscattering
- 15. Absorption corrections
- 16. Fluorescence corrections
- 17. Matrix corrections in practice
- 18. Light element analysis
- Appendix: origin of characteristic X-rays.
by "Nielsen BookData"