Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
著者
書誌事項
Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
（Materials Research Society symposium proceedings, v. 441）
Materials Research Society, c1997
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
An interdisciplinary group of materials scientists, physicists, chemists and engineers come together in this book to discuss recent advances in the structure and morphology of thin films. Both scientific and technological issues are addressed. Work on thin films for a host of applications including microelectronics, optics, tribology, biomedical technologies and microelectromechanical systems (MEMS) are featured. Topics include: kinetics of growth; grain growth; instabilities, segregation and ordering; silicides; metallization; stresses in thin films; deposition and growth simulations; energetic growth processes; diamond films and carbide and nitride films.
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