{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA32593664.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA32593664#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA32593664.json"},"dc:title":[{"@value":"Software product assurance : techniques for reducing software risk"}],"dc:creator":"William L. Bryan and Stanley G. Siegel","dc:publisher":[{"@value":"PTR Prentice Hall"}],"dcterms:extent":"xxxii, 499 p.","cinii:size":"27 cm","dc:language":"eng","dc:date":"1988","cinii:ncid":"BA32593664","cinii:ownerCount":"1","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Bryan, William L. (William Littell)"}]},{"@id":"https://ci.nii.ac.jp/author/DA07675592#entity","@type":"foaf:Person","foaf:name":[{"@value":"Siegel, Stanley G."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA014927","@type":"foaf:Organization","foaf:name":"広島市立大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac.lib.hiroshima-cu.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BA32593664"}}],"prism:publicationDate":["c1988"],"cinii:note":["Includes bibliographical references and indexes"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Computer+software+--+Quality+control","dc:title":"Computer software -- Quality control"}],"dcterms:hasPart":[{"@id":"urn:isbn:0135005051"}]}]}