1997 IEEE International Conference on Microelectronic Test Structures proceedings, March 17-20, 1997, Monterey, California

Author(s)

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

Bibliographic Information

1997 IEEE International Conference on Microelectronic Test Structures proceedings, March 17-20, 1997, Monterey, California

sponsored by the IEEE Electron Devices Society

IEEE Service Center, c1997

• : softbound
• : casebound

Other Title

97CH35914 97CB35914

ICMTS

Note

"IEEE catalog number: 97CH35914" -- T.p. verso

Details

• NCID: BA32596888
• ISBN:
  • 0780332431
  • 078033244X
• LCCN: 96075517
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway
• Pages/Volumes: viii, 225 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/5
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses