1997 IEEE International Conference on Microelectronic Test Structures proceedings, March 17-20, 1997, Monterey, California

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

1997 IEEE International Conference on Microelectronic Test Structures proceedings, March 17-20, 1997, Monterey, California

sponsored by the IEEE Electron Devices Society

IEEE Service Center, c1997

• : softbound
• : casebound

タイトル別名

97CH35914 97CB35914

ICMTS

注記

"IEEE catalog number: 97CH35914" -- T.p. verso

詳細情報

• NII書誌ID(NCID): BA32596888
• ISBN:
  • 0780332431
  • 078033244X
• LCCN: 96075517
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: viii, 225 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/5
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses