1997 IEEE International Reliability Physics Symposium proceedings : 35th annual, Denver, Colorado, April 8, 9, 10, 1997

著者

• IEEE International Reliability and Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1997 IEEE International Reliability Physics Symposium proceedings : 35th annual, Denver, Colorado, April 8, 9, 10, 1997

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c1997

• : soft.
• : case.

タイトル別名

1997 IEEE Annual International Reliability Physics

97CH35983

注記

Includes bibliographies

"IEEE Catalog No. 97CH35983"

内容説明・目次

内容説明

These papers deal with physical mechanisms that effect the reliability or performance of integrated circuits and microelectronic devices. Original work is presented that identifies failure or degradation mechanisms, insight into existing failure mechanisms, innovative analytic techniques, and ways to build in reliability. Improvements in yield factors are reported.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA32598963
• ISBN:
  • 0780335759
  • 0780335767
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: vi, 384 p.
• 大きさ: 28 cm