Electron microscopy : principles and fundamentals

著者

• Amelinckx, Severin

書誌事項

Electron microscopy : principles and fundamentals

edited by S. Amelinckx ... [et al.]

VCH, c1997

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

目次

Stationary Beam Methods. Scanning Beam Methods. Index.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA33229623
• ISBN:
  • 3527294791
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Weinheim
• ページ数/冊数: xii, 515 p.
• 大きさ: 25 cm